LTC2607 (9)

The LTC2607 is available from analog devices inc. at Xecor. Designed for dual 16-bit digital-to-analog conversion, the LTC2607 offers high performance, low power consumption, and flexibility with its rail-to-rail voltage output and I²C interface. Available in a 12-lead DFN package, it is ideal for mobile communications, process control, industrial automation, and instrumentation. Whether used in automatic test equipment or precision control systems, this series ensures monotonic performance, low crosstalk, and efficient operation for demanding applications. Xecor is an authorized distributor for analog devices inc.. Please view our extensive selection of the LTC2607 series below.

Part Number Description Package Inventory Add To Bom
LTC2607CDE 16-bit resolution DFN-12 7,945
LTC2607CDE#PBF LTC2607CDE#PBF DAC with 2 channels, 16-bit resolution, and 12-pin DFN EP packaging DFN-12 5,179
LTC2607CDE#TRPBF DAC 2-CH 16-bit 12-Pin DFN EP T/R DFN-12 8,689
LTC2607IDE#TRPBF DAC 2-CH 16-bit 12-Pin DFN EP T/R DFN-12 6,925
LTC2607CDE-1#TRPBF DAC 2-CH 16-bit 12-Pin DFN EP T/R DFN-12 7,262
LTC2607IDE-1#PBF DAC 2-CH 16-bit 12-Pin DFN EP Tube DFN-12 7,213
LTC2607IDE#PBF LTC2607IDE#PBF represents the pinnacle of DAC technology DFN-12 3,295
LTC2607CDE-1#PBF DAC 2-CH 16-bit 12-Pin DFN EP Tube DFN-12 8,943
LTC2607IDE-1#TRPBF DAC 2-CH 16-bit 12-Pin DFN EP T/R DFN-12 8,310

Key Featrues

Smallest Pin-Compatible Dual DACs: The LTC2607, LTC2617, and LTC2627 offer 16-, 14-, and 12-bit resolutions respectively in a compact 12-lead DFN package. This small footprint enables integration into space-constrained applications, enhancing design flexibility and reducing PCB size.
Guaranteed Monotonic Over Temperature: The DACs are guaranteed to be monotonic across the operating temperature range (0°C to 70°C), ensuring consistent and reliable performance in varying environmental conditions, which is critical for precision applications like instrumentation and process control.
400kHz I²C Interface: The high-speed I²C interface allows for efficient communication with microcontrollers or other digital systems, enabling fast data transfer and real-time control, which is beneficial in applications such as mobile communications and automatic test equipment.
Wide 2.7V to 5.5V Supply Range: The wide operating voltage range makes these DACs versatile for use in both low-power and standard voltage systems, improving compatibility across diverse applications and reducing the need for additional voltage regulation components.
Low Power Operation and Power Down Mode: With a low power consumption of 260µA per DAC at 3V and a power-down mode reducing current to 1µA, these DACs are ideal for battery-powered or energy-efficient systems, extending battery life and enhancing overall system efficiency.

Applications

Precision Instrumentation Control: The LTC2607/LTC2617/LTC2627 DACs are ideal for precision instrumentation control, providing accurate voltage outputs for calibration and signal generation. Their rail-to-rail output and low crosstalk ensure reliable performance in high-precision measurement systems, such as medical devices or laboratory equipment.
Industrial Automation Systems: These DACs are well-suited for industrial automation systems, where they can be used to control actuators, valves, or motors with high accuracy. Their wide supply range and low power operation make them ideal for integration into control systems operating in harsh industrial environments.
Mobile Communication Signal Processing: The LTC2607/LTC2617/LTC2627 DACs can be used in mobile communication systems to generate precise analog signals for modulation and demodulation processes. Their small form factor and low power consumption make them suitable for portable devices and base stations.
Automatic Test Equipment (ATE): These DACs are perfect for ATE applications, where they can provide accurate voltage outputs for testing and validating electronic components. Their double-buffered data latches and asynchronous update pin enable precise timing and synchronization, ensuring reliable performance in high-speed test environments.