VIPER38LE

Elevating high-voltage conversion to new levels, the VIPER38LE sets itself apart as a sophisticated device that integrates an 800 V rugged power MOSFET with PWM current-mode control. This combination not only offers superior performance but also expands the boundaries by allowing very high input voltages, surpassing traditional constraints. The IC's outstanding energy efficiency, along with its ability to operate in burst mode under light loads, positions it as a frontrunner in meeting even the most rigorous energy-saving regulations. The inclusion of an adjustable extra power timer (EPT) feature adds another layer of versatility, enabling the IC to withstand overload conditions for short durations, ensuring reliability under dynamic load conditions. By incorporating integrated HV startup, sense FET, and oscillator with jitter, the VIPER38LE simplifies circuit design by reducing the need for additional components. Additionally, the device offers a comprehensive range of protections, including dual-level OCP, output overvoltage protection, short-circuit protection, and thermal shutdown with hysteresis, enhancing system safety and longevity. The automatic restart capability following fault resolution further underscores the VIPER38LE's commitment to uninterrupted and reliable operation

Key Features

• 800 V avalanche-rugged power MOSFET allowing ultra wide range input V_ac to be achieved
• Embedded HV start-up and sense FET
• PWM current-mode controller
• OCP with selectable threshold (I_Dlim) and 2^nd OCP with higher value (I_DMAX) to protect the IC from transformer saturation or short-circuit of the secondary diode
• 30 mW no-load consumption at 230 V_ac
• Two operating frequencies:
  • 60 kHz (L type) or 115 kHz (H type)
• Jittered frequency reduces the EMI
• Extra power timer (EPT) blanks the overload current for few seconds
• Output overvoltage protection with tight tolerance and digital noise filter
• Soft-start reduces the stress during startup and increases IC lifetime
• Automatic restart after a fault condition
• Thermal shutdown increases system reliability and IC lifetime