V62/06602-01XE

The TLV5614 is a versatile digital-to-analog converter designed for a wide range of applications. With its flexible four-wire serial interface, it can easily integrate with various digital platforms, including TMS320™ DSP family, SPI™, QSPI™, and Microwire™ serial ports. The device is capable of operating on two independent supplies, allowing for a high degree of customization in voltage levels. This makes it suitable for use in diverse settings, from battery-powered devices to industrial control systems. Additionally, the TLV5614 features a programmable settling time, enabling designers to balance speed and power consumption according to their specific requirements. The integration of a high-impedance buffer also simplifies the design process by reducing the need for additional drive components. With its rail-to-rail output buffer and power-down mode, the TLV5614 is well-suited for single-voltage applications, offering stability and efficiency in a compact 16-terminal TSSOP package. The device is also designed to withstand a wide temperature range, making it suitable for use in harsh environments

Key Features

• Controlled Baseline
  • One Assembly
  • One Test Site
  • One Fabrication Site
• Extended Temperature Performance of -55°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree⁽¹⁾
• Four 12-Bit Digital-to-Analog Converters (DACs)
• Programmable Settling Time of Either 3 µs or 9 µs (Typ)
• TMS320™ DSP Family, (Q)SPI™, and Microwire™ Compatible Serial Interface
• Internal Power-On Reset
• Low Power Consumption:
  8 mW, Slow Mode - 5-V Supply
  3.6 mW, Slow Mode - 3-V Supply
• Reference Input Buffer
• Voltage Output Range . . . 2× the Reference Input Voltage
• Monotonic Overtemperature
• Dual 2.7-V to 5.5-V Supply (Separate Digital and Analog Supplies)
• Hardware Power Down (10 nA)
• Software Power Down (10 nA)
• Simultaneous Update
• applications
  • Battery-Powered Test Instruments
  • Digital Offset and Gain Adjustment
  • Industrial Process Controls
  • Machine and Motion Control Devices
  • Communications
  • Arbitrary Waveform Generation

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

TMS320 is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.